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Programmable event testing
US patent 11461106
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Statements
instance of
United States patent
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title
Programmable event testing
(English)
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country
United States of America
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owned by
Texas Instruments
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author name string
Kai Chirca (Dallas, TX)
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Timothy D. Anderson (University Park, TX)
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significant event
filing
point in time
23 October 2020
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consent
point in time
4 October 2022
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Identifiers
patent number
US11461106
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