(Q51164180)

English

Ellipsometric characterization of doped Ge<sub>0.95</sub>Sn<sub>0.05</sub> films in the infrared range for plasmonic applications.

scientific article published in September 2016

Statements

Ellipsometric characterization of doped Ge<sub>0.95</sub>Sn<sub>0.05</sub> films in the infrared range for plasmonic applications. (English)

Identifiers

 
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