User:Jheald/bmt/analysis

analysis

• Analytical Technique [1]
  • DC [2]; DSC [3]; ES [4]; FI [5]; IC [6]; LIBS [7]; MF [8]; MI [9]; NAA [10]; NMR [11]; OD [12]; PIXE [13]; RCD [14]; RHX [15]; RTI [16]; SG [17]; SIMS [18]; TGA [19]; TL [20]; TLC [21]; TST [22]; VP-SEM [23]; VPES [24]; XPS [25]; XRF [26]; Xauth [27];
  • AAS [28]
    • F-AAS [29]; GF-AAS [30];
  • FTIR [31]
    • FTIR-ATR [32]; FTIR-M [33];
  • GC [34]
    • GC-FID [35]; GC-MS [36]; PY-GC-MS [37];
  • HPLC [38]
    • HPLC-MS [39]; HPLC-PDA [40];
  • ICP [41]
    • ICP-AES [42]
      • LA-ICP-AES [43];
    • ICP-MS [44]
      • LA-ICP-MS [45];
  • Optical Microscopy [46]
    • Gemological Microscopy [47];
    • Reflectance Microscopy [48]
      • Metalurgical Microscopy [49];
    • Transmission Microscopy [50]
      • Petrographic Microscopy [51]; Wood Microscopy [52];
  • RS [53]
    • FTR [54]; SERRS [55]; SERS [56];
  • SEM [57]
    • SEM-EDX [58]; SEM-VP [59];
    • SEM-I [60]
      • BEI [61]; CL [62]; SEI [63];
  • Technical Imaging [64]
    • IR-R [65]; IRR [66]; UV-F [67]; UV-L [68]; UV-R [69]; VIS [70];
    • VIL [71]
      • VIIL [72];
  • X-Radiography [73]
    • BR [74]; ER [75];
    • CT [76]
      • CTS [77];
    • Digital Radiography [78]
      • CR [79]; DR [80];
  • XRD [81]
    • XRDC [82]; XRDD [83];
• Project Investigation Types [84]
  • Atomic Absorption [85]; Authenticity [86]; Conservation [87]; Dating Measurement [88]; Electrotype [89]; Emission Spectroscopy [90]; Extra Mural Examination [91]; Mettallographic Examination [92]; Polargraphic Analysis [93]; Radiography [94]; Restoration [95]; Treasure Trove Examination [96]; X-Ray Diffraction [97];