(Q118977052)

English

Absolute distance (thickness) metrology using wavelength scanning interferometry

doctoral thesis submitted to the University of North Carolina at Charlotte by Amit Ravindra Suratkar

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instance of

doctoral thesis

1 reference

reference URL

https://repository.charlotte.edu/islandora/object/etd:475

publisher

J. Murrey Atkins Library

retrieved

2 June 2023

inception

2009

1 reference

reference URL

https://repository.charlotte.edu/islandora/object/etd:475

publisher

J. Murrey Atkins Library

retrieved

2 June 2023

title

Absolute distance (thickness) metrology using wavelength scanning interferometry (English)

1 reference

reference URL

https://repository.charlotte.edu/islandora/object/etd:475

publisher

J. Murrey Atkins Library

retrieved

2 June 2023

author name string

Amit Ravindra Suratkar

1 reference

reference URL

https://repository.charlotte.edu/islandora/object/etd:475

publisher

J. Murrey Atkins Library

retrieved

2 June 2023

thesis submitted to

University of North Carolina at Charlotte

1 reference

reference URL

https://repository.charlotte.edu/islandora/object/etd:475

publisher

J. Murrey Atkins Library

retrieved

2 June 2023

language of work or name

English

1 reference

reference URL

https://repository.charlotte.edu/islandora/object/etd:475

publisher

J. Murrey Atkins Library

retrieved

2 June 2023

number of pages

116 page

1 reference

reference URL

https://repository.charlotte.edu/islandora/object/etd:475

publisher

J. Murrey Atkins Library

retrieved

2 June 2023

full work available at URL

https://repository.charlotte.edu/islandora/object/etd:475

1 reference

publisher

J. Murrey Atkins Library

reference URL

https://repository.charlotte.edu/islandora/object/etd:475

retrieved

2 June 2023

on focus list of Wikimedia project

WikiProject UNC Charlotte Library

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ISBN-13

978-1-109-25580-5

1 reference

reference URL

https://charlotte.primo.exlibrisgroup.com/discovery/search?query=any,contains,991009803599704091&tab=Everything&search_scope=MyInst_and_CI&vid=01UNCC_INST:01UNCC_INST&lang=en&offset=0

publisher

J. Murrey Atkins Library

2 June 2023

1 reference

https://charlotte.primo.exlibrisgroup.com/discovery/search?query=any,contains,991009803599704091&tab=Everything&search_scope=MyInst_and_CI&vid=01UNCC_INST:01UNCC_INST&lang=en&offset=0

(Q118977052)

Absolute distance (thickness) metrology using wavelength scanning interferometry

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