(Q126015056)

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Visibility and charge density imaging of 2-dimensional semiconductors and devices studied using optical microscopy techniques IRM and BALM

PhD thesis of Nathan Ullberg

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doctoral thesis

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Visibility and charge density imaging of 2-dimensional semiconductors and devices studied using optical microscopy techniques IRM and BALM (English)

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Étude de la visibilité de matériaux 2D semiconducteurs et de leur densité de charge dans des dispositifs électroniques par les techniques de microscopie optique IRM et BALM (French)

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author

Nathan Ullberg

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publication date

2023

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full work available at URL

https://theses.fr/2023UPAST219

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National Thesis Number (France)

2023UPAST219

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SUDOC editions

276579054

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(Q126015056)

Visibility and charge density imaging of 2-dimensional semiconductors and devices studied using optical microscopy techniques IRM and BALM

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