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Static secondary-ion mass spectrometry
mass spectrometric technique used to analyze the composition of solid surfaces
SSIMS
Static secondary ion mass spectrometry
Static SIMS
S-SIMS
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Statements
subclass of
secondary ion mass spectrometry
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Identifiers
Freebase ID
/m/03chfyz
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Microsoft Academic ID
187529661
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OpenAlex ID
C187529661
1 reference
stated in
OpenAlex
retrieved
26 January 2022
reference URL
https://docs.openalex.org/download-snapshot/snapshot-data-format
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enwiki
Static secondary-ion mass spectrometry
itwiki
SIMS statico
ptwiki
ToF-SIMS
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