(Q31150149)

29 June 2017

title

Scattering of A-scale electron probes in silicon (English)

1 reference

29 June 2017

Dwyer C

1

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29 June 2017

Etheridge J

series ordinal

2

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29 June 2017

publication date

1 September 2003

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29 June 2017

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29 June 2017

volume

96

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29 June 2017

issue

3-4

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29 June 2017

page(s)

343-360

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Towards sub-Å electron beams

29 June 2017

cites work

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900100-1

7 January 2021

Progress in aberration-corrected scanning transmission electron microscopy

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900100-1

7 January 2021

Incoherent Imaging of Crystals Using Thermally Scattered Electrons

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900100-1

7 January 2021

Prospects of atomic resolution imaging with an aberration-corrected STEM.

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900100-1

7 January 2021

Simulation of thermal diffuse scattering including a detailed phonon dispersion curve

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900100-1

7 January 2021

The scattering of electrons by atoms and crystals. I. A new theoretical approach

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900100-1

7 January 2021

The principles and interpretation of annular dark-field Z-contrast imaging

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900100-1

7 January 2021

10.1016/S0304-3991(03)00100-1

Identifiers

DOI

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29 June 2017

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