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Atom probe specimen preparation with a dual beam SEM/FIB miller

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Atom probe specimen preparation with a dual beam SEM/FIB miller (English)

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Miller MK

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Russell KF

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publication date

25 February 2007

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25 July 2017

volume

107

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issue

9

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761-766

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cites work

Field-ion specimen preparation using focused ion-beam milling

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Crossref

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https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2007.02.023

retrieved

7 January 2021

Some aspects of atom probe specimen preparation and analysis of thin film materials.

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https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2007.02.023

retrieved

7 January 2021

First data from a commercial local electrode atom probe (LEAP).

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https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2007.02.023

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7 January 2021

Strategies for fabricating atom probe specimens with a dual beam FIB

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https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2007.02.023

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7 January 2021

In situ site-specific specimen preparation for atom probe tomography

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reference URL

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2007.02.023

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7 January 2021

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10.1016/J.ULTRAMIC.2007.02.023

1 reference

stated in

Europe PubMed Central

PubMed publication ID

17403581

retrieved

25 July 2017

PubMed publication ID

17403581

1 reference

stated in

Europe PubMed Central

PubMed publication ID

17403581

retrieved

25 July 2017

(Q33280849)

Atom probe specimen preparation with a dual beam SEM/FIB miller

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