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Damage in III-V compounds during focused ion beam milling

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17481325

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Damage in III-V compounds during focused ion beam milling (English)

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25 July 2017

Rubanov S

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25 July 2017

Munroe PR

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2

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publication date

1 October 2005

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Microscopy and Microanalysis

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volume

11

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issue

5

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page(s)

446-455

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cites work

Redeposition effects in transmission electron microscope specimens of FeAl-WC composites prepared using a focused ion beam

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https://api.crossref.org/works/10.1017%2FS1431927605050294

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21 January 2018

The application of FIB milling for specimen preparation from crystalline germanium.

1 reference

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https://api.crossref.org/works/10.1017%2FS1431927605050294

retrieved

21 January 2018

FIB-induced damage in silicon.

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https://api.crossref.org/works/10.1017%2FS1431927605050294

retrieved

21 January 2018

The correlation between ion beam/material interactions and practical FIB specimen preparation

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https://api.crossref.org/works/10.1017%2FS1431927605050294

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7 January 2021

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Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam

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7 January 2021

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Surface damage formation during ion-beam thinning of samples for transmission electron microscopy

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DOI

10.1017/S1431927605050294

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PubMed publication ID

17481325

1 reference

stated in

Europe PubMed Central

PubMed publication ID

17481325

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25 July 2017

(Q33283753)

Damage in III-V compounds during focused ion beam milling

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