(Q33331676)

25 July 2017

title

Effect of a physical phase plate on contrast transfer in an aberration-corrected transmission electron microscope (English)

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25 July 2017

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B Gamm

1

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25 July 2017

K Schultheiss

series ordinal

2

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25 July 2017

D Gerthsen

series ordinal

3

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25 July 2017

R R Schröder

series ordinal

4

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25 July 2017

publication date

18 March 2008

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25 July 2017

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25 July 2017

volume

108

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25 July 2017

issue

9

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25 July 2017

page(s)

878-884

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Electron microscopy image enhanced

25 July 2017

cites work

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.02.009

High-resolution imaging with an aberration-corrected transmission electron microscope.

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.02.009

Transmission electron microscopy with Zernike phase plate

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.02.009

The fabrication and application of Zernike electrostatic phase plate.

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.02.009

Design of a microfabricated, two-electrode phase-contrast element suitable for electron microscopy

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.02.009

The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imaging.

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.02.009

High-resolution transmission electron microscopy using negative spherical aberration

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.02.009

Optimizing phase contrast in transmission electron microscopy with an electrostatic (Boersch) phase plate

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.02.009

A spherical aberration-corrected 200 kV TEM

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.02.009

On the importance of fifth-order spherical aberration for a fully corrected electron microscope.

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.02.009

10.1016/J.ULTRAMIC.2008.02.009

7 January 2021

Identifiers

DOI

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25 July 2017

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