(Q34036828)
Statements
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Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy (English)
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Peter Hermann
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Michael Hecker
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Dmytro Chumakov
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Martin Weisheit
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Jochen Rinderknecht
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Artem Shelaev
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Pavel Dorozhkin
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Lukas M Eng
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16 September 2011
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111
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11
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1630-1635
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Identifiers
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