(Q34186666)

English

Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging.

scientific article

Statements

Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging (English)
0 references

Identifiers

 
edit
    edit
      edit
        edit
          edit
            edit
              edit
                edit
                  edit