(Q36326354)

13 August 2017

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title

Analysis of organic films and interfacial layers by infrared spectroscopic ellipsometry (English)

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13 August 2017

main subject

infrared spectroscopy

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Hinrichs K

1

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13 August 2017

Gensch M

series ordinal

2

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13 August 2017

Esser N

series ordinal

3

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13 August 2017

publication date

1 November 2005

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13 August 2017

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13 August 2017

volume

59

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13 August 2017

issue

11

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13 August 2017

page(s)

272-282

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Soft-mode hardening in SrTiO3 thin films

13 August 2017

cites work

1 reference

https://api.crossref.org/works/10.1366%2F000370205774783106

Instrumentation for FT-IR reflection spectroscopy with synchrotron radiation.

21 January 2018

1 reference

https://api.crossref.org/works/10.1366%2F000370205774783106

Fourier transform infrared synchrotron ellipsometry for studying the anisotropy of small organic samples.

21 January 2018

1 reference

https://api.crossref.org/works/10.1366%2F000370205774783106

Apertureless near-field vibrational imaging of block-copolymer nanostructures with ultrahigh spatial resolution.

21 January 2018

1 reference

https://api.crossref.org/works/10.1366%2F000370205774783106

10.1366/000370205774783106

21 January 2018

Identifiers

DOI

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13 August 2017

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