(Q36604384)

English

The use of low temperature X-ray diffraction to evaluate freezing methods used in freeze-fracture electron microscopy

scientific article published on January 1, 1978

Statements

The use of low temperature X-ray diffraction to evaluate freezing methods used in freeze-fracture electron microscopy (English)
1 January 1978
103-113

Identifiers

 
edit
    edit
      edit
        edit
          edit
            edit
              edit
                edit
                  edit