(Q40079883)

17 September 2017

title

Nanoscale holographic interferometry for strain measurements in electronic devices (English)

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17 September 2017

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Martin Hÿtch

1

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17 September 2017

Florent Houdellier

series ordinal

2

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17 September 2017

Florian Hüe

series ordinal

3

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17 September 2017

Etienne Snoeck

series ordinal

4

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17 September 2017

language of work or name

English

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publication date

1 June 2008

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17 September 2017

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17 September 2017

volume

453

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17 September 2017

issue

7198

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17 September 2017

page(s)

1086-1089

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https://scigraph.springernature.com/pub.10.1038/nature07049

17 September 2017

exact match

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cites work

Giant piezoresistance effect in silicon nanowires

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Strained silicon as a new electro-optic material

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Electron Holography: Phase Imaging with Nanometer Resolution

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Effects of elastic anisotropy on strain distributions in decahedral gold nanoparticles

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopy

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Calibration of projector lens distortions

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Optical performance of carbon-nanotube electron sources

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Off-axis electron holography with a dual-lens imaging system and its usefulness in 2-D potential mapping of semiconductor devices.

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Optical system for double-biprism electron holography

1 reference

https://api.crossref.org/works/10.1038%2FNATURE07049

7 January 2021

Identifiers

DOI

10.1038/NATURE07049

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Dimensions Publication ID

17 September 2017

1037917981

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