(Q42275672)
Statements
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A pattern matching approach to the automatic selection of particles from low-contrast electron micrographs (English)
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V Abrishami
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A Zaldívar-Peraza
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J M de la Rosa-Trevín
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J Vargas
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J Otón
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R Marabini
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Y Shkolnisky
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J M Carazo
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C O S Sorzano
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19 August 2013
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29
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19
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2460-2468
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Identifiers
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28 January 2021
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