(Q42909239)
Statements
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Effects of cryogenic sample analysis on molecular depth profiles with TOF-secondary ion mass spectrometry (English)
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Alan M Piwowar
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John S Fletcher
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Jeanette Kordys
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Nicholas P Lockyer
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Nicholas Winograd
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John C Vickerman
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1 October 2010
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82
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19
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8291-8299
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