(Q44993530)

English

Characterization of pore structure in a nanoporous low-dielectric-constant thin film by neutron porosimetry and X-ray porosimetry.

scientific article

In more languages
default for all languages
No label defined

No description defined

Statements

Characterization of pore structure in a nanoporous low-dielectric-constant thin film by neutron porosimetry and X-ray porosimetry (English)

Identifiers

 
edit
    edit
      edit
        edit
          edit
            edit
              edit
                edit
                  edit