(Q46059004)
Statements
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Sample stacking in CZE using dynamic thermal junctions II: analytes with high dpKa/dT crossing a single thermal junction in a BGE with low dpH/dT. (English)
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Marcos Mandaji
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Gabriel Rübensam
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Rodrigo Barcellos Hoff
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Sandro Hillebrand
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Tarso Ledur Kist
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1 May 2009
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30
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9
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1510-1515
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Identifiers
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