(Q46059004)

English

Sample stacking in CZE using dynamic thermal junctions II: analytes with high dpKa/dT crossing a single thermal junction in a BGE with low dpH/dT.

scientific article

Statements

Sample stacking in CZE using dynamic thermal junctions II: analytes with high dpKa/dT crossing a single thermal junction in a BGE with low dpH/dT. (English)

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