(Q46110237)
Statements
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TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology (English)
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Roel De Mondt
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Luc Van Vaeck
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Andreas Heile
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Heinrich F Arlinghaus
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Frank Vangaever
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Jens Lenaerts
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26 February 2009
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393
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8
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1917-1921
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