(Q47748920)

English

Study of the dielectric properties near the band gap by VEELS: gap measurement in bulk materials

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scholarly article

1 reference

Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

Study of the dielectric properties near the band gap by VEELS: gap measurement in bulk materials (English)

1 reference

Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

author name string

Schamm S

1

1 reference

Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

Zanchi G

2

1 reference

Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

publication date

1 September 2003

1 reference

Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

Ultramicroscopy

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Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

96

1 reference

Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

3-4

1 reference

Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

559-564

1 reference

Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

Electron and hole doping in NiO

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900116-5

7 January 2021

based on heuristic

inferred from DOI database lookup

Nanoscale EELS analysis of dielectric function and bandgap properties in gaN and related materials

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900116-5

7 January 2021

based on heuristic

inferred from DOI database lookup

Bulk electronic structure of SrTiO3: Experiment and theory

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900116-5

7 January 2021

based on heuristic

inferred from DOI database lookup

Electron-Energy-Loss Scattering near a Single Misfit Dislocation at the GaAs/GaInAs Interface

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900116-5

7 January 2021

based on heuristic

inferred from DOI database lookup

Contamination and the quantitative exploitation of EELS low-loss experiments

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900116-5

7 January 2021

based on heuristic

inferred from DOI database lookup

Optical properties and temperature dependence of the interband transitions of cubic and hexagonal GaN

1 reference

https://api.crossref.org/works/10.1016%2FS0304-3991%2803%2900116-5

7 January 2021

based on heuristic

inferred from DOI database lookup

Identifiers

10.1016/S0304-3991(03)00116-5

1 reference

Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

PubMed publication ID

1 reference

Europe PubMed Central

PubMed publication ID

5 February 2018

http://europepmc.org/abstract/MED/12871816

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