(Q51172412)

English

Full recovery of electron damage in glass at ambient temperatures.

scientific article published on 26 May 2006

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scholarly article

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

Full recovery of electron damage in glass at ambient temperatures. (English)

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

author name string

Mkhoyan KA

1

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

Silcox J

2

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

Ellison A

3

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

Ast D

4

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

Dieckmann R

5

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

language of work or name

0 references

publication date

26 May 2006

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

Physical Review Letters

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

96

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

20

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

205506

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

Single spin detection by magnetic resonance force microscopy

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.96.205506

21 January 2018

Experimental study of ELNES at grain boundaries in alumina: intergranular radiation damage effects on Al-L23 and O-K edges

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.96.205506

21 January 2018

The electronic structure at the atomic scale of ultrathin gate oxides

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.96.205506

21 January 2018

Identifiers

10.1103/PHYSREVLETT.96.205506

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

PubMed publication ID

1 reference

Europe PubMed Central

PubMed publication ID

31 March 2018

http://europepmc.org/abstract/MED/16803186

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