(Q5159384)

English

conductive atomic force microscopy

method of measuring the microscopic topography of a material

current sensing atomic force microscopy
CS-AFM
CAFM

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26 January 2022

https://docs.openalex.org/download-snapshot/snapshot-data-format

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Wikipedia(2 entries)

dewiki Leitfähigkeits-Rasterkraftmikroskopie
enwiki Conductive atomic force microscopy

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