(Q51594687)
Statements
A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy. (English)
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Muneyuki Fukuda
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Satoshi Tomimatsu
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Kuniyasu Nakamura
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Masanari Koguchi
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Hiroyasu Shichi
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Kaoru Umemura
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1 January 2004
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53
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5
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479-483
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