(Q52889163)
Statements
Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry. (English)
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Frank Siewert
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Jana Buchheim
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Sébastien Boutet
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Garth J Williams
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Paul A Montanez
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Jacek Krzywinski
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Riccardo Signorato
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1 February 2012
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20
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4
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4525-4536
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