(Q52889163)
Statements
Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry. (English)
Frank Siewert
Jana Buchheim
Sébastien Boutet
Garth J Williams
Paul A Montanez
Jacek Krzywinski
Riccardo Signorato
1 February 2012
20
4
4525-4536