Wikidata

(Q56766252)

English

Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy

scholarly article in Carbon, vol. 46 no. 11, September 2008

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title
Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy (English)
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main subject
graphene
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microscopy
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author name string
P. Nemes-Incze
series ordinal
1
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Z. Osváth
series ordinal
2
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K. Kamarás
series ordinal
3
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L.P. Biró
series ordinal
4
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publication date
September 2008
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published in
Carbon
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volume
46
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issue
11
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page(s)
1435-1442
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Identifiers

arXiv ID
0812.0690
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