(Q56766252)

English

Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy

scholarly article in Carbon, vol. 46 no. 11, September 2008

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Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy (English)
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P. Nemes-Incze
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Z. Osváth
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K. Kamarás
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L.P. Biró
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September 2008
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46
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11
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1435-1442
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