(Q56866324)

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High-resolution electron backscatter diffraction: An emerging tool for studying local deformation

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title

High-resolution electron backscatter diffraction: An emerging tool for studying local deformation (English)

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author name string

A J Wilkinson

series ordinal

1

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E E Clarke

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2

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T B Britton

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3

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P Littlewood

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4

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P S Karamched

series ordinal

5

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publication date

27 April 2010

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published in

Journal of Strain Analysis for Engineering Design

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volume

45

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issue

5

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page(s)

365-376

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cites work

Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy

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reference URL

https://api.crossref.org/works/10.1243%2F03093247JSA587

retrieved

21 January 2018

Analysis of local orientation gradients in deformed single crystals.

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Crossref

reference URL

https://api.crossref.org/works/10.1243%2F03093247JSA587

retrieved

21 January 2018

Advances in SEM-based diffraction studies of defects and strains in semiconductors

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Crossref

reference URL

https://api.crossref.org/works/10.1243%2F03093247JSA587

retrieved

21 January 2018

The effect of crystal orientation on the indentation response of commercially pure titanium: experiments and simulations

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reference URL

https://api.crossref.org/works/10.1243%2F03093247JSA587

retrieved

21 January 2018

Accuracy assessment of elastic strain measurement by EBSD.

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reference URL

https://api.crossref.org/works/10.1243%2F03093247JSA587

retrieved

21 January 2018

Some geometrical relations in dislocated crystals

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stated in

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reference URL

https://api.crossref.org/works/10.1243%2F03093247JSA587

retrieved

21 January 2018

Crystallographic aspects of geometrically-necessary and statistically-stored dislocation density

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stated in

Crossref

reference URL

https://api.crossref.org/works/10.1243%2F03093247JSA587

retrieved

21 January 2018

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10.1243/03093247JSA587

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(Q56866324)

High-resolution electron backscatter diffraction: An emerging tool for studying local deformation

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