(Q57777833)

English

The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence

article by J. S. Rigden et al published January 1997 in Journal of Materials Research

In more languages

edit

Statements

instance of

scholarly article

0 references

title

The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence (English)

0 references

1 reference

J. S. Rigden

1

0 references

R. J. Newport

series ordinal

2

0 references

G. Bushnell-Wye

series ordinal

3

0 references

publication date

January 1997

0 references

published in

Journal of Materials Research

0 references

volume

12

0 references

issue

01

0 references

page(s)

264-276

0 references

Identifiers

DOI

10.1557/JMR.1997.0034

0 references

(Q57777833)

The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence

Statements

Identifiers

Sitelinks

Wikipedia(0 entries)

Wikibooks(0 entries)

Wikinews(0 entries)

Wikiquote(0 entries)

Wikisource(0 entries)

Wikiversity(0 entries)

Wikivoyage(0 entries)

Wiktionary(0 entries)

Multilingual sites(0 entries)