(Q58622498)

English

Transmission electron microscopy evidence of the defect structure in Si nanowires synthesized by laser ablation

article

In more languages
default values for all languages
No label defined

No description defined

Statements

Transmission electron microscopy evidence of the defect structure in Si nanowires synthesized by laser ablation (English)
0 references
N Wang
0 references
Y.H Tang
0 references
Y.F Zhang
0 references
D.P Yu
0 references
C.S Lee
0 references
I Bello
0 references
S.T Lee
0 references
February 1998
0 references
283
0 references
5-6
0 references
368-372
0 references

Identifiers

 
edit
    edit
      edit
        edit
          edit
            edit
              edit
                edit
                  edit