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(Q58622667)

English

Interpretation of tapping mode atomic force microscopy data using amplitude-phase-distance measurements

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title
Interpretation of tapping mode atomic force microscopy data using amplitude-phase-distance measurements (English)
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author name string
X. Chen
series ordinal
1
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M.C. Davies
series ordinal
2
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C.J. Roberts
series ordinal
3
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S.J.B. Tendler
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4
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P.M. Williams
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5
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J. Davies
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6
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A.C. Dawkes
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7
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J.C. Edwards
series ordinal
8
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publication date
December 1998
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volume
75
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issue
3
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page(s)
171-181
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cites work

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