(Q58642580)

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Molecular dynamics simulations of dynamic force microscopy: applications to the Si(111)-7×7 surface

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Molecular dynamics simulations of dynamic force microscopy: applications to the Si(111)-7×7 surface (English)

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author name string

A Abdurixit

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1

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A Baratoff

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2

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E Meyer

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3

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publication date

April 2000

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published in

Applied Surface Science

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volume

157

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issue

4

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page(s)

355-360

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cites work

Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.

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Forces and frequency shifts in atomic-resolution dynamic-force microscopy

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Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

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https://api.crossref.org/works/10.1016%2FS0169-4332%2899%2900566-8

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Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7 x 7

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ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION

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Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy

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Computer simulation of local order in condensed phases of silicon

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Interatomic potentials for silicon structural energies

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Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111)

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Identifiers

DOI

10.1016/S0169-4332(99)00566-8

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arXiv ID

cond-mat/0003004

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(Q58642580)

Molecular dynamics simulations of dynamic force microscopy: applications to the Si(111)-7×7 surface

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