(Q58642605)

English

Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip-sample interactions and cantilever oscillation characteristics

No description defined

In more languages

edit

Statements

instance of

scholarly article

0 references

title

Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip-sample interactions and cantilever oscillation characteristics (English)

0 references

main subject

general chemistry

0 references

condensed matter physics

0 references

author name string

R. Bennewitz

series ordinal

1

0 references

M. Bammerlin

series ordinal

2

0 references

M. Guggisberg

series ordinal

3

0 references

C. Loppacher

series ordinal

4

0 references

A. Baratoff

series ordinal

5

0 references

E. Meyer

series ordinal

6

0 references

H.-J. Güntherodt

series ordinal

7

0 references

publication date

May 1999

0 references

published in

Surface and Interface Analysis

0 references

volume

27

0 references

issue

5-6

0 references

page(s)

462-466

0 references

cites work

Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.

1 reference

stated in

Crossref

reference URL

https://api.crossref.org/works/10.1002%2F%28SICI%291096-9918%28199905%2F06%2927%3A5%2F6%3C462%3A%3AAID-SIA543%3E3.0.CO%3B2-0

retrieved

21 January 2018

Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

1 reference

stated in

Crossref

reference URL

https://api.crossref.org/works/10.1002%2F%28SICI%291096-9918%28199905%2F06%2927%3A5%2F6%3C462%3A%3AAID-SIA543%3E3.0.CO%3B2-0

retrieved

21 January 2018

Dynamic SFM with true atomic resolution on alkali halide surfaces

1 reference

stated in

Crossref

reference URL

https://api.crossref.org/works/10.1002%2F%28SICI%291096-9918%28199905%2F06%2927%3A5%2F6%3C462%3A%3AAID-SIA543%3E3.0.CO%3B2-0

retrieved

21 January 2018

Forces and frequency shifts in atomic-resolution dynamic-force microscopy

1 reference

stated in

Crossref

reference URL

https://api.crossref.org/works/10.1002%2F%28SICI%291096-9918%28199905%2F06%2927%3A5%2F6%3C462%3A%3AAID-SIA543%3E3.0.CO%3B2-0

retrieved

21 January 2018

Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

1 reference

stated in

Crossref

reference URL

https://api.crossref.org/works/10.1002%2F%28SICI%291096-9918%28199905%2F06%2927%3A5%2F6%3C462%3A%3AAID-SIA543%3E3.0.CO%3B2-0

retrieved

21 January 2018

Multifunctional probe microscope for facile operation in ultrahigh vacuum

1 reference

stated in

Crossref

reference URL

https://api.crossref.org/works/10.1002%2F%28SICI%291096-9918%28199905%2F06%2927%3A5%2F6%3C462%3A%3AAID-SIA543%3E3.0.CO%3B2-0

retrieved

21 January 2018

Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers

1 reference

stated in

Crossref

reference URL

https://api.crossref.org/works/10.1002%2F%28SICI%291096-9918%28199905%2F06%2927%3A5%2F6%3C462%3A%3AAID-SIA543%3E3.0.CO%3B2-0

retrieved

21 January 2018

Kelvin probe force microscopy

1 reference

stated in

Crossref

reference URL

https://api.crossref.org/works/10.1002%2F%28SICI%291096-9918%28199905%2F06%2927%3A5%2F6%3C462%3A%3AAID-SIA543%3E3.0.CO%3B2-0

retrieved

21 January 2018

Identifiers

DOI

10.1002/(SICI)1096-9918(199905/06)27:5/6<462::AID-SIA543>3.0.CO;2-0

0 references

(Q58642605)

Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip-sample interactions and cantilever oscillation characteristics

Statements

Identifiers

Sitelinks

Wikipedia(0 entries)

Wikibooks(0 entries)

Wikinews(0 entries)

Wikiquote(0 entries)

Wikisource(0 entries)

Wikiversity(0 entries)

Wikivoyage(0 entries)

Wiktionary(0 entries)

Multilingual sites(0 entries)