(Q58801129)

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Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy

scholarly article in Physical Review B, vol. 62 no. 20, November 2000

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Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy (English)

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Thomas Stifter

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Othmar Marti

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2

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Bharat Bhushan

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3

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language of work or name

English

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publication date

15 November 2000

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number of pages

7

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Physical Review B

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volume

62

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issue

20

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page(s)

13667-13673

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cites work

Atomic force microscope

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https://api.crossref.org/works/10.1103%2FPHYSREVB.62.13667

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21 January 2018

Observation of single charge carriers by force microscopy

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https://api.crossref.org/works/10.1103%2FPHYSREVB.62.13667

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21 January 2018

Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

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https://api.crossref.org/works/10.1103%2FPHYSREVB.62.13667

retrieved

21 January 2018

Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy

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https://api.crossref.org/works/10.1103%2FPHYSREVB.62.13667

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21 January 2018

A comprehensive kinetic meniscus model for prediction of long-term static friction

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https://api.crossref.org/works/10.1103%2FPHYSREVB.62.13667

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21 January 2018

Atomic‐scale and microscale friction studies of graphite and diamond using friction force microscopy

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https://api.crossref.org/works/10.1103%2FPHYSREVB.62.13667

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21 January 2018

Jumping mode scanning force microscopy

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reference URL

https://api.crossref.org/works/10.1103%2FPHYSREVB.62.13667

retrieved

21 January 2018

Identifiers

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10.1103/PHYSREVB.62.13667

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(Q58801129)

Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy

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