(Q58830176)

English

A low-temperature scanning tunneling microscope with in-situ sample cleaving

No description defined

Statements

A low-temperature scanning tunneling microscope with in-situ sample cleaving (English)
0 references
A.D. Kent
0 references
Ch. Renner
0 references
Ph. Niedermann
0 references
J.-G. Bosch
0 references
Ø. Fischer
0 references
July 1992
0 references
42-44
0 references
1632-1637
0 references

Identifiers

 
edit
    edit
      edit
        edit
          edit
            edit
              edit
                edit
                  edit