(Q59086728)

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Atomic-resolution chemical analysis using a scanning transmission electron microscope

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Atomic-resolution chemical analysis using a scanning transmission electron microscope (English)

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transmission electron microscope

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corrigendum / erratum

Erratum: Atomic-resolution chemical analysis using a scanning transmission electron microscope

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author name string

N. D. Browning

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M. F. Chisholm

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S. J. Pennycook

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English

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publication date

November 1993

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Nature

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366

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issue

6451

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page(s)

143-146

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https://scigraph.springernature.com/pub.10.1038/366143a0

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Chemically sensitive structure-imaging with a scanning transmission electron microscope

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High-resolution incoherent imaging of crystals

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Visibility of single atoms

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Absorptive potentials due to ionization and thermal diffuse scattering by fast electrons in crystals

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Silicon L2,3 core absorption obtained at the buried Al/Si(111) interface

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Theoretical determination of angularly-integrated energy loss functions for anisotropic materials

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Correlation between hole depletion and atomic structure at high angle grain boundaries in YBa2Cu3O7−δ

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Core-level electron-energy-loss spectroscopy as a local probe for the electronic structure of the Co/Si(111) interface

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10.1038/366143A0

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1052171637

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(Q59086728)

Atomic-resolution chemical analysis using a scanning transmission electron microscope

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