(Q59181905)

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Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy

article published in 2007

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title

Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy (English)

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author name string

Laura Fumagalli

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1

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Giorgio Ferrari

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2

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Marco Sampietro

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3

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Gabriel Gomila

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4

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language of work or name

English

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publication date

10 December 2007

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published in

Applied Physics Letters

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volume

91

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issue

24

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page(s)

243110

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cites work

Technology and metrology of new electronic materials and devices

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https://api.crossref.org/works/10.1063%2F1.2821119

retrieved

21 January 2018

Instrumentation for direct, low frequency scanning capacitance microscopy, and analysis of position dependent stray capacitance

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https://api.crossref.org/works/10.1063%2F1.2821119

retrieved

21 January 2018

Nanoscale capacitance imaging with attofarad resolution using ac current sensing atomic force microscopy

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Crossref

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https://api.crossref.org/works/10.1063%2F1.2821119

retrieved

21 January 2018

Nondestructive thickness measurement of biological layers at the nanoscale by simultaneous topography and capacitance imaging

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https://api.crossref.org/works/10.1063%2F1.2821119

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21 January 2018

Deflection–voltage curve modelling in atomic force microscopy and its use in DC electrostatic manipulation of gold nanoparticles

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https://api.crossref.org/works/10.1063%2F1.2821119

retrieved

21 January 2018

WSXM: a software for scanning probe microscopy and a tool for nanotechnology.

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reference URL

https://api.crossref.org/works/10.1063%2F1.2821119

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21 January 2018

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DOI

10.1063/1.2821119

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(Q59181905)

Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy

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