(Q62097817)

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Accurate measurements of crystal structure factors using a FEG electron microscope

scientific article published in December 1997

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Accurate measurements of crystal structure factors using a FEG electron microscope (English)

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author name string

G. Ren

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1

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J.M. Zuo

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2

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L.-M. Peng

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3

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publication date

December 1997

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published in

Micron

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volume

28

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issue

6

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page(s)

459-467

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cites work

Determination of structure factors, lattice strains and accelerating voltage by energy-filtered convergent beam electron diffraction

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Structure factor determination in non-centrosymmetric crystals by a two-dimensional CBED-based multi-parameter refinement method

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https://api.crossref.org/works/10.1016%2FS0968-4328%2897%2900034-6

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7 January 2021

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Debye–Waller Factors and Absorptive Scattering Factors of Elemental Crystals

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https://api.crossref.org/works/10.1016%2FS0968-4328%2897%2900034-6

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7 January 2021

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Robust Parameterization of Elastic and Absorptive Electron Atomic Scattering Factors

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https://api.crossref.org/works/10.1016%2FS0968-4328%2897%2900034-6

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7 January 2021

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https://api.crossref.org/works/10.1016%2FS0968-4328%2897%2900034-6

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7 January 2021

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10.1016/S0968-4328(97)00034-6

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(Q62097817)

Accurate measurements of crystal structure factors using a FEG electron microscope

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