(Q62559055)

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The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy

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The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy (English)

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1 reference

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T. M. Smeeton

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C. J. Humphreys

series ordinal

2

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J. S. Barnard

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3

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M. J. Kappers

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4

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publication date

17 April 2006

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published in

Journal of Materials Science

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volume

41

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issue

9

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page(s)

2729-2737

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exact match

https://scigraph.springernature.com/pub.10.1007/s10853-006-7876-x

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DOI

10.1007/S10853-006-7876-X

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1021051025

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(Q62559055)

The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy

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