Wikidata

(Q62559067)

English

Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope

scholarly article by T. M. Smeeton et al published 29 December 2003 in Applied Physics Letters

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Statements

title
Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope (English)
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author name string
T. M. Smeeton
series ordinal
1
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M. J. Kappers
series ordinal
2
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J. S. Barnard
series ordinal
3
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M. E. Vickers
series ordinal
4
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C. J. Humphreys
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5
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publication date
29 December 2003
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volume
83
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issue
26
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page(s)
5419-5421
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Identifiers

DOI
10.1063/1.1636534
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