(Q62675592)

English

Energy distribution of surface states in the Si band-gap for MOS diodes obtained from XPS measurements under biases

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Energy distribution of surface states in the Si band-gap for MOS diodes obtained from XPS measurements under biases (English)
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H. Kobayashi
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Y. Yamashita
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T. Mori
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Y. Nakato
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K.H. Park
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Y. Nishioka
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March 1995
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326
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1-2
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124-132
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