Wikidata

(Q74393926)

English

Structural relaxation of Pb defects at the (111)Si/SiO2 interface as a function of oxidation temperature: The Pb-generation-stress relationship

scientific article published on 01 July 1993

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title
Structural relaxation of Pb defects at the (111)Si/SiO2 interface as a function of oxidation temperature: The Pb-generation-stress relationship (English)
1 reference
stated in
Europe PubMed Central
PubMed publication ID
10008634
reference URL
https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:10008634%20AND%20SRC:MED&resulttype=core&format=json
retrieved
10 November 2019

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