(Q78670742)

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:12484838%20AND%20SRC:MED&resulttype=core&format=json

15 December 2019

title

High resolution atomic force microscopic imaging of the Si(111)-(7 x 7) surface: contribution of short-range force to the images (English)

1 reference

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15 December 2019

1

1 reference

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15 December 2019

author name string

Y Hasegawa

series ordinal

2

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:12484838%20AND%20SRC:MED&resulttype=core&format=json

15 December 2019

language of work or name

English

0 references

publication date

10 December 2002

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:12484838%20AND%20SRC:MED&resulttype=core&format=json

15 December 2019

published in

Physical Review Letters

1 reference

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15 December 2019

volume

89

1 reference

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15 December 2019

issue

26

1 reference

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15 December 2019

page(s)

266105

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15 December 2019

cites work

Atomic force microscope

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111)

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

Low temperature scanning force microscopy of the Si(111)-(7x7) surface

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

Forces and frequency shifts in atomic-resolution dynamic-force microscopy

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy.

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

Quantitative measurement of short-range chemical bonding forces

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

Physical interpretation of frequency-modulation atomic force microscopy

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.89.266105

10.1103/PHYSREVLETT.89.266105

21 January 2018

Identifiers

DOI

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:12484838%20AND%20SRC:MED&resulttype=core&format=json

15 December 2019

1 reference