(Q84001005)

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Measurement of the spin relaxation time of single electrons in a silicon metal-oxide-semiconductor-based quantum dot

scientific article published on 02 March 2010

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Measurement of the spin relaxation time of single electrons in a silicon metal-oxide-semiconductor-based quantum dot (English)

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20367000

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30 January 2020

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20367000

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30 January 2020

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Xiao M

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1

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Jiang HW

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2 March 2010

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Physical Review Letters

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20367000

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104

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20367000

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9

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096801

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(Q84001005)

Measurement of the spin relaxation time of single electrons in a silicon metal-oxide-semiconductor-based quantum dot

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