(Q98809031)

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A New Method to Inspect and Recognize Fabric Defects Based on Wavelet Analysis and Neural Network

article published in 2005

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一种新的基于小波分析与神经网络的织物疵点检测与识别方法 (Chinese)

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CNKI

reference URL

http://www.cnki.com.cn/Article/CJFDTOTAL-YQXB200506016.htm

retrieved

31 August 2020

A New Method to Inspect and Recognize Fabric Defects Based on Wavelet Analysis and Neural Network (English)

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CNKI

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http://en.cnki.com.cn/Article_en/CJFDTOTAL-YQXB200506016.htm

31 August 2020

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卿湘运

1

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CNKI

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http://www.cnki.com.cn/Article/CJFDTOTAL-YQXB200506016.htm

retrieved

31 August 2020

段红

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2

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CNKI

reference URL

http://www.cnki.com.cn/Article/CJFDTOTAL-YQXB200506016.htm

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31 August 2020

魏俊民

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3

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CNKI

reference URL

http://www.cnki.com.cn/Article/CJFDTOTAL-YQXB200506016.htm

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31 August 2020

王璐娟

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4

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CNKI

reference URL

http://www.cnki.com.cn/Article/CJFDTOTAL-YQXB200506016.htm

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31 August 2020

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http://www.cnki.com.cn/Article/CJFDTOTAL-YQXB200506016.htm

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31 August 2020

publication date

2005

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CNKI

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http://www.cnki.com.cn/Article/CJFDTOTAL-YQXB200506016.htm

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31 August 2020

published in

Chinese Journal of Scientific Instrument

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CNKI

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http://www.cnki.com.cn/Article/CJFDTOTAL-YQXB200506016.htm

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31 August 2020

issue

06

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CNKI

reference URL

http://www.cnki.com.cn/Article/CJFDTOTAL-YQXB200506016.htm

retrieved

31 August 2020

Identifiers

DOI

10.19650/J.CNKI.CJSI.2005.06.016

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CJFD journal article ID

YQXB200506016

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(Q98809031)

A New Method to Inspect and Recognize Fabric Defects Based on Wavelet Analysis and Neural Network

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