(Q125290288)

English

Evaluation of the Topographical Surface Changes of Silicon Wafers after Annealing and Plasma Cleaning

scientific article published on 13 December 2019

Statements

Evaluation of the Topographical Surface Changes of Silicon Wafers after Annealing and Plasma Cleaning (English)
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Sebastian Stach
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Ştefan Ţălu
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Rashid Dallaev
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Ali Arman
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13 December 2019
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12
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11
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2563-2570
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