(Q27304657)

English

Serial section scanning electron microscopy (S3EM) on silicon wafers for ultra-structural volume imaging of cells and tissues

scientific article (publication date: 2012)

Statements

Serial section scanning electron microscopy (S3EM) on silicon wafers for ultra-structural volume imaging of cells and tissues (English)
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Heinz Horstmann
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Kurt Sätzler
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Daniel Aydin
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Thomas Kuner
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2012
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7
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e35172
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4
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