(Q31914530)

5 July 2017

title

Comparison of high-temperature and laser-quenched Si(111) using low-energy electron diffraction (English)

1 reference

5 July 2017

2

Williams ED

1 reference

5 July 2017

Phaneuf RJ

1

1 reference

5 July 2017

language of work or name

English

0 references

publication date

1 March 1987

1 reference

5 July 2017

1 reference

5 July 2017

volume

35

1 reference

5 July 2017

issue

8

1 reference

5 July 2017

page(s)

4155-4158

1 reference

7 × 7 Reconstruction on Si(111) Resolved in Real Space

5 July 2017

cites work

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.35.4155

Reexamination of the structure of a laser-stabilized Si{111}1 x 1 surface

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.35.4155

Tunneling images of germanium surface reconstructions and phase boundaries

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.35.4155

7 x 7 reconstruction of Ge(111) surfaces under compressive strain

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.35.4155

New reconstructions on silicon (111) surfaces

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.35.4155

Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.35.4155

21 January 2018

Identifiers

DOI

10.1103/PHYSREVB.35.4155

1 reference

5 July 2017

1 reference