(Q33313120)
Statements
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"Depth-profiling" and quantitative characterization of the size, composition, shape, density, and morphology of fine particles with SPLAT, a single-particle mass spectrometer (English)
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Alla Zelenyuk
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Juan Yang
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Chen Song
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Dan Imre
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4 January 2008
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112
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669-677
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Identifiers
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