(Q33330870)

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Characterization of a-SiC(x):H thin films as an encapsulation material for integrated silicon based neural interface devices

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  • Characterization of a-SiCx:H thin films as an encapsulation material for integrated silicon based neural interface devices
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Characterization of a-SiC(x):H thin films as an encapsulation material for integrated silicon based neural interface devices (English)
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