(Q33360636)

26 July 2017

title

Experimental quantification of annular dark-field images in scanning transmission electron microscopy (English)

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26 July 2017

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Susanne Stemmer

2

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author name string

James M Lebeau

series ordinal

1

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26 July 2017

publication date

15 July 2008

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26 July 2017

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26 July 2017

volume

108

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26 July 2017

issue

12

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26 July 2017

page(s)

1653-1658

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Visibility of single atoms

26 July 2017

cites work

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

Chemically sensitive structure-imaging with a scanning transmission electron microscope

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

Contributions to the contrast in experimental high-angle annular dark-field images.

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

Hunting the Stobbs factor

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

Influence of orientation on the contrast of high-angle annular dark-field images of silicon

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

A high efficiency annular dark field detector for STEM.

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs.

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

Depth-dependent imaging of individual dopant atoms in silicon.

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

Artifacts in aberration-corrected ADF-STEM imaging

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

Quantitative Atomic Resolution Scanning Transmission Electron Microscopy

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

Critical role of inelastic interactions in quantitative electron microscopy

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2008.07.001

10.1016/J.ULTRAMIC.2008.07.001

7 January 2021

Identifiers

DOI

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26 July 2017

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